JASCO is proud to announce the release of two new FT-IR Microscope accessories, the IRT-5000 and IRT-7000, which can be easily interfaced with either JASCO’s FT/IR-4000 or FT/IR-6000 spectrometers. These industrial microscopes feature innovative functions such as “Smart Mapping”, newly developed for infrared micro analysis and IR imaging.

The IRT-5000 is an FT-IR microscope system featuring dual detector capability and multiple objectives with excellent signal to noise ratio. The IRT-7000 is a multi-channel IR microscope for IR imaging, and with the combination of the FT/IR-6000 and step scan option offers an advanced capability for dynamic imaging as well as time-resolved measurements of a specific area.

In addition to high-performance and ease-of-use operations, both microscopes feature a “Smart Mapping” function as standard, which enables mapping analyses of a limited area without the use of an automated sample stage. By using the manual stage, mapping measurements, line measurements, multi-point analyses and ATR mapping can be easily performed in addition to single-point measurements. The “Smart Monitoring” function allows simultaneous viewing of the full sample image on the professional software display using an integrated high resolution Ccd camera supplier. An optional automatic X-Y-Z sample stage enables auto-focus and mapping analysis of a large sample area.