192 press releases : Metrology, Inspection, Surveillance



Releases  161 -180
Date 2009-02-02 LMI Technologies LMI Technologies Proclaims Visionlink as a New Distribution Partner

LMI Technologies Proclaims Visionlink as a New Distribution Partner

January 26th, 2009, Vancouver, British Columbia, Canada - LMI Technologies Inc. (LMI) recently announced Visionlink as a new distributor for Italy. As partners, LMI looks forward to working with Visionlink who specialize in vision component distribution and consultancy. Their skills and experience in vision applications offer yet another level of support for LMI customers. The LMI sales team has...


Date 2009-01-23 SMAC Ultra precise XY stage critical in automotive part manufacturing

Ultra precise XY stage critical in automotive part manufacturing

A new 50 nanometer resolution linear motor based XY stage, LXY25 series, incorporating cross roller linear bearing has been developed by SMAC Corporation. It has been used to solve a critical automotive part problem at a major Asian automobile manufacturer. The part is a machined aluminium casting with 3 critical bores machined in it. Required tolerance is less than 4 micron on each bore. High ...


Date 2009-01-20 Ocean Optics New Optical Transmittance Spectrophotometer (OTS)

New Optical Transmittance Spectrophotometer (OTS)

Ocean Optics has combined its expertise in miniature spectrometers and precision optics to create a compact system for real-time transmittance measurement of ophthalmic lenses and other optical components. Typical applications The OTS is especially useful for measuring tint colour, visual transmittance and UV cut-off of ophthalmic lenses, optical coatings, windows and filters and sun lens mater...


Date 2009-01-20 LMI Technologies LMI Technologies Announces Distribution Agreement with DVC Machinevision bv

LMI Technologies Announces Distribution Agreement with DVC Machinevision bv

January 8th, 2009, Vancouver, British Columbia – The Vision 2008 tradeshow in Stuttgart, Germany at the beginning of November presented a wonderful opportunity for LMI to launch maestro™ to the machine vision industry. As industry members know, Germany is the hub for innovative engineering design, so it’s no surprise that most of the key customers, manufacturers, and distributors in this market wer...


Date 2009-01-16 FARO CNC Manufacturer Uses FARO Laser Tracker

CNC Manufacturer Uses FARO Laser Tracker

Thermwood Corporation is currently the oldest CNC router company. An important process for their CNC machines is axis alignment verification. The mechanical instruments they used, however, were not the desired solution, as they required multiple setups, which in turn required a great deal of back-tracking to verify alignment states. There was no quick or easy way to monitor changes resulting from...


Date 2009-01-16 FARO New Video: Robot Calibration with the FARO Gage

New Video: Robot Calibration with the FARO Gage

Parallel Robotics uses the FARO Gage to overcome the limitations of fixed CMMs in robot calibration. Before, it took six hours to calibrate each robot, but this has been reduced to one hour with the Gage. This convenience and efficiency is priceless in the design and production of high-precision positioning systems.


Date 2009-01-15 Asylum Research Asylum Research Introduces Cypher™ AFM

Asylum Research Introduces Cypher™ AFM

Santa Barbara, CA, Oct. 29, 2008 – Asylum Research, the technology leader in Atomic Force/Scanning Probe Microscopy (AFM/SPM), announced today that it is introducing the Cypher AFM, the industry’s first completely new small sample AFM/SPM in over a decade. Cypher is the world’s highest resolution AFM, providing more capability, more control, and more modularity with unprecedented ease of use. The...


Date 2009-01-13 Third Dimension Software Third Dimension launches GapGun online forum

Third Dimension launches GapGun online forum

In response to a rapidly growing customer base, Third Dimension today launched a dedicated online forum. The forum, which is accessible to all GapGun operators, administrators, resellers and partners, provides a central location in which GapGun metrology and technical matters can be easily and openly discussed. Head of Support Steve Rogers explained "We are constantly looking for ways to help ou...


Date 2009-01-12 RENISHAW Metris and Renishaw announce agreement on the licensing of CMM software

Metris and Renishaw announce agreement on the licensing of CMM software

On 5th January 2009 Metris and Renishaw announced a recent agreement under which Renishaw licenses the source code of the Metris Camio CMM software. In order to support their own further development Renishaw has also employed a number of Metris engineers. Metris preserves full ownership of the original source code and the Camio brand name. Metris will continue to develop and market Camio as its...


Date 2009-01-09 KAPPA opto electronics NEW! StarTracker

NEW! StarTracker

StarTracker is an inexpensive, lightweight modular solution for position measurement in space, especially developed for nano-satellites. Issues: - Identification and correction of defective pixels on the CCD sensor, - Determination of X/Y coordinates of all stars with pixel accuracy, - Determination of apparent magnitude of all stars with 12-bit accuracy, - 6 m marginal magniturde if used ...


Date 2009-01-05 ERIEZ Eriez® E-Z Tec® XR-81 Inspection Systems Offer Reliable Inspection

Eriez® E-Z Tec® XR-81 Inspection Systems Offer Reliable Inspection

Eriez® introduces the advanced E-Z Tec® XR-81 X-Ray Inspection system, part of the company’s line of highly sensitive automated inspection systems. The XR-81 is specifically designed to inspect large cartons or cases for foreign objects, count and damaged or missing product. This state-of-the-art inspection system is constructed of a durable stainless steel cabinet and features a 15-inch color...


Date 2008-12-18 Schleuniger Crimp Quality Assurance: Cross-sectional views quick, clean & at a low price

Crimp Quality Assurance: Cross-sectional views quick, clean & at a low price

Creating cross-sectional views of crimped connections with chemical etching technique is time-consuming and requires strict adherence to on-the-job safety regulations. Schleuniger’s new MicroGraph System with a combined saw-polishing process and innovative electrolyte staining technology allows the creation of high-quality cross-sectional views in a fraction of the time needed with “conventional” m...


Date 2008-12-16 Nanosurf Swiss nano-microscope delivers first images recorded on Mars

Swiss nano-microscope delivers first images recorded on Mars

Liestal (Switzerland) — For the first time ever, nanostructures have been measured on another planet. On July 9, the NASA "Phoenix" Mars Probe recorded images with nanometer resolution (one nanometer roughly corresponds to 0.00000004 inch) using its onboard Swiss-made atomic force microscope, and successfully transmitted these images back to Earth. The first images of the microscope — which was dev...


Date 2008-12-16 Casella CEL Chance to win an iPod Nano

Chance to win an iPod Nano

Follow the link on our new Tuff Cookie Teaser on our new homepage and not only will you be sent further information on our new range of personal air samplers, but you will automatically be entered for a draw to win one of 3 iPod Nanos! From January 12th. The Casella Measurement website is at www.casellameasurement.com


Date 2008-12-16 LMI Technologies LMI announces distribution agreement with Japan F.A. Systems Corporation (JFAS)

LMI announces distribution agreement with Japan F.A. Systems Corporation (JFAS)

LMI Technologies Inc. (LMI) is happy to announce that they have signed a distribution agreement with Japan F.A. Systems Corporation (JFAS) to initiate a new added sales value channel in Japan for the following LMI product lines: maestro™, HexSight™ and FireSync™. When asked why JFAS chose LMI as a new supplier, Mr. Naoyuki Kani, CEO of JFAS simply says, “both LMI and JFAS share similar busines...


Date 2008-12-11 LMI Technologies LMI Announces New Selcom RoLine™ 1130 Sensor for High Speed Pavement Profiling

LMI Announces New Selcom RoLine™ 1130 Sensor for High Speed Pavement Profiling

LMI Technologies introduced the new Selcom™ High Speed RoLine™ 1130 Sensor for high speed pavement profiling at the 20th Annual Road Profiler User’s Group (RPUG) Meeting in Austin, Texas October 26-29 2008. RPUG is an industry user group which serves as a forum for the exchange of information between end users, data collectors, vendors, construction and design engineers and researchers who have an ...


Date 2008-12-04 FARO FARO Laser ScanArm Online Video Showcases New Technology

FARO Laser ScanArm Online Video Showcases New Technology

FARO, the world leader in portable computer-aided measurement hardware and software, announced that it released an online video demonstration of its all-new FARO Laser ScanArm V3. The FARO Laser ScanArm was the first-ever seven-axis contact/non-contact measurement device with a fully integrated laser scanner. It enables users to collect simple point variations with the Arm's hard probe, then las...


Date 2008-12-02 Nikon Instruments Europe Nikon expands advanced imaging solutions to include SEM

Nikon expands advanced imaging solutions to include SEM

Nikon Instruments Europe and JEOL have announced an agreement that appoints Nikon as the official European distributor of the innovative NeoScope benchtop SEM (scanning electron microscope). Whether used by trained electron microscopists as a compact screening instrument, or by lab technicians seeking a higher resolution alternative to the light microscope, the NeoScope will help accelerate the pac...


Date 2008-12-02 Bipol New Videoscope with articulation and TFT screen

New Videoscope with articulation and TFT screen

New - Video Endoscope with 4 Way Joystick remote controlled Articulation, LCD Screen and SD Card for image recording. High quality image at a very affordable price. Totally autonomous. Diamete : 6.9mm Working length : 1.500 & 3.000 mm Direction of vision : 0° or 90° Joystick Articulation Control Stand-alone Imaging Unit High Navigation Ability Adjustable Brightness


Date 2008-12-02 VISION ENGINEERING Metallurgical microscope with superb resolution and contrast.

Metallurgical microscope with superb resolution and contrast.

Vision Engineering’s DX51 metallurgical microscope for routine applications including materials analysis, metal processing and building materials. Vision Engineering is a world leader in optical solutions for inspection and measurement with over 50 years of design and manufacturing for engineers by engineers. The DX51 metallurgical microscope makes easy work of material analysis for a wide ...


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