A new OEM agreement between Renishaw plc (UK) and NT-MDT (Russia) establishes a framework for bringing nano-scale imaging and analysis to researchers.

During the recent International Raman Microscopy Conference (ICORS XXI) in London, Renishaw plc (UK), and NT-MDT (Russia) signed an OEM agreement, whereby NT-MDT will sell, install, and support special inVia Raman systems for integration with its NTEGRA AFM. This alliance provides an unsurpassed nanotechnology visualisation and analysis system for research and industry.

A survey of over 75 key scanning probe microscope (SPM) users (A.D. Little 2007) showed clearly that SPM is seen as complementary to light microscopy, with the main differentiator being its nano-scale resolution and ability to measure physical properties - especially under controlled conditions (e.g. temperature, humidity, pressure). Chemical analysis can now be added to this list through the use of conventional confocal Raman spectroscopy for micrometre resolution, and tip-enhanced Raman scattering (TERS) for molecular resolution.

The stringent requirements for investigation of materials at the molecular level are met by every element of the NT-MDT AFM design. The geometry of the system makes it perfectly suited for confocal Raman spectroscopy and TERS because it can scan the sample and laser. Additionally the fundamental design of the AFM head, innovative use of special low thermal expansion coefficient materials, and use of precision electrical components for the closed loop feedback scanning system, all contribute to an AFM with exceptionally low drift.......