•Wider range of use: RoHS compliance screening, analysis of precious metals, examination of small samples as well as inclusions in glass and metal, forensic analysis

•More powerful silicon drift detector guarantees maximum measuring speed and enables analyses with a working distance of 20 millimeters

Kleve, Chicago, March, 2009 – SPECTRO Analytical Instruments presents the third generation of the SPECTRO MIDEX micro XRF spectrometer for the first time at Pittcon 2009 (March 8th to 13th, 2009, Chicago). The new model has been improved in many ways and presents itself as being faster, more powerful and more flexible than its predecessor. It has been designed for the electric and electronics industries, precious metal market, the automotive and aerospace industries and forensic laboratories ......