• SPECTRO xSORT handheld XRF instrument now available with application packages for RoHS compliance screening, environmental testing and mining applications
• Silicon drift detector with high signal throughput enables extremely fast and accurate analysis of all important elements from sulfur to uranium


Kleve, Chicago, March 2009 – SPECTRO Analytical Instruments presents a new range of applications for the SPECTRO xSORT handheld XRF instrument at Pittcon 2009 (March 8 to March 13, Chicago). First introduced to the market in September of 2008, SPECTRO xSORT’s original metal analysis capabilities have been expanded to include applications for RoHS compliance and lead screening as well as for the examination of soil in environmental testing and the direct analysis of ores, concentrates and tailings....