Palo Alto, CA -- Varian, Inc. (NasdaqGS: VARI) introduced its new dual wavelength X-ray diffractometer for the analysis of small molecules and proteins. The SuperNova™ is the first dual wavelength diffraction system to use entirely high intensity micro-source X-ray technology. It includes innovations in both X-ray technology and data analysis, enabling faster
results even for the most challenging crystals.

Single crystal X-ray diffraction is used to determine the structure of small molecules and proteins at high resolution. Applications include chemistry, geology, physics, structural biology and pharmaceutical research. The trend in crystallography is towards the ability to analyze smaller, poorer crystal samples and to increase the speed of sample throughput.

The system is ideal for the study of challenging samples in small molecule and protein crystallography. It includes co-mounted, dual wavelength and high intensity X-ray microsources of both molybdenum and copper wavelength. It is the first dual wavelength system incorporating purely high intensity Mo and Cu micro-source X-ray technology.

For more technical information about Varian’s X-ray diffraction products, please visit
http://www.varianinc.com/products/pr/supernova_lp.html